Benoît C. Forget, Isabelle Barbereau, Danièle Fournier
Laboratoire d'Instrumentation, Université Pierre & Marie Curie
ESPCI, 10 rue Vauquelin, 75231 Paris cedex 05, FRANCE
Suneet Tuli and
Amalendu B. Battacharyya
C.A.R.E., Indian Institue of Technology, Hauz Khas, New Delhi 110016, INDIA
abstract
In this paper we demonstrate that a photothermal microscopy experiment can
be used to determine the electronic diffusivity (or carrier mobility) in the
same way it is now widely used to measure locally thermal diffusivity of
various non semiconductor materials. The main difficulty lies in the fact
that in order to separate thermal and carrier diffusion, the experiment must
be performed for a relatively large distance between the pump and probe
beams. Photothermal signals are therefore rather weak and great experimental
care must be taken. We present and discuss experimental results on Si.