Publications dans des revues avec comité de lecture /
Articles in journals

1. S. Tuli, A. B. Bhattacharyya, B. C. Forget and D. Fournier, Mirage effect based depth profiling of micromachined silicon structures, Sens. and Actuators A (Phys.), A64 (3), 203-207 (1998).
2. B. C. Forget, S. Grauby, D. Fournier, P. Gleyzes and A. C. Boccara, High resolution AC temperature field imaging, Electron. Lett., 33 (20), 1688 (1997)
3. B.C FORGET, I.BARBEREAU, D. FOURNIER, S. TULI and A.B. BATTACHARYYA, Electronic diffusivity measurement in silicon by photothermal microscopy, Appl.Phys.Lett. 69(8), 1107 (1996).
4. M. NESTOROS, B.C. FORGET, C. CHRISTOFIDES and A. SEAS, Photothermal Reflection vs. Temperature : Quantitative analysis, Phys. Rev. B 51 (20), 14115 (1995) .
5. B.C. FORGET, D. FOURNIER et V.E. GUSEV, Auger Recombination in Modulated Photoreflectance Characterisation of Silicon Wafers,Appl.Phys.Lett. 61 (19), 2341 (1992).

1. B.C. Forget, Electronic materials, thin films and devices,Conférence invitée au 10th International Meeting on Photoacoustic and Photothermal Phenomena, Rome, (août 1998).
2. I. Barbereau-Brassac, S. Teysseyre, B. C. Forget D. Fournier, Photothermal microscopy investigation of silicon wafers : effects of surface recombination velocity, accepté au 10th International Meeting on Photoacoustic and Photothermal Phenomena, Rome, (août 1998).
3. S. Grauby, B. C. Forget and D. Fournier, 2 MHz modulated photothermal imaging using a CCD camera coupled to a multichannel lock-in detection, accepté au 10th International Meeting on Photoacoustic and Photothermal Phenomena, Rome, (août 1998).
4. P. Jeanneau, L. Bertrand, B. C. Forget and D. Fournier, Tomography with mirage effect, accepté au 10th International Meeting on Photoacoustic and Photothermal Phenomena, Rome, (août 1998).
5. I.BARBEREAU, B.C FORGET and D. FOURNIER, Characterization of electronic transport properties by scanning photothermal microscopy, Progress in Natural Science, 6, 479-482, 1997.
6. I.BARBEREAU, B.C FORGET and D. FOURNIER, Photothermal microscopy investigation of implanted wafers : effect of thermal diffusivity, Progress in Natural Science, 6, 503-506, 1997.
7. M. NESTOROS, B.C. FORGET, C. CHRISTOFIDES and A. SEAS, Photothermal Reflection vs. Temperature (40 to 300K), Progress in Natural Science, 6, 507-510, 1997.
8. A.B. BATTACHARYYA, D. FOURNIER , S. TULI and B.C FORGET, Non destructive photothermal, photoreflectance and photoacoustic techniques for the characterization of materials and devices, in Semiconductor and Devices, ed. K. Lal, Narosa Publ. House (New Delhi), 253-260 (1996).
9. K. PLAMANN, D. FOURNIER, B.C. FORGET and A.C. BOCCARA, Microscopic photothermal measurements on polycrystalline diamond, Diam. Rel. Mat., 5 699 (1996)
10. B.C. FORGET, D. FOURNIER et V.E. GUSEV, Special Effects of 3D Diffusion of Plasma Waves : Non Linear Photoreflectance Signal, J. Physique IV, colloque C7, 151-154 (1994).
11. B.C. FORGET, D. FOURNIER et V.E. GUSEV, Non Linear Recombination Processes : Application to Quantitative Implantattion Characterization,J .Physique IV, colloque C7, 155-158 (1994).
12. B.C. FORGET and D. FOURNIER, Implantation characterisation in silicon wafers by non linear photoreflectance, Materials Science and Engineering B24, 199 (1994).
13. B.C. FORGET, D. FOURNIER and V.E. GUSEV, Effect of nonlinear Recombination in Modulated Photoreflectance Characterisation of Silicon Wafers, Appl. Surface Science 63, 255 (1993).
14. B.C. FORGET and D. FOURNIER, Surface Characterisation by Modulated Photoreflectance, in Photoacoustic and Photothermal Phenomena III, editor D. Bicanic, Springer-Verlag, Berlin, 375 (1991).
15. B.C. FORGET and D. FOURNIER, Reflection and Transmission of Thermal Waves and Plasma Waves in Silicon Wafers, in Photoacoustics and Photothermal Phenomena III, editor D. Bicanic, Springer-Verlag, Berlin, 414 (1991).
16. B.C. FORGET and D. FOURNIER, Electronic Transport Properties Characterisation of Silicon Wafers by Modulated Photoreflectance, BIADS '91, Journal de Physique IV 1, 277, (1991).
17. D. FOURNIER and B.C. FORGET, Thermal Wave Probing of the Optical, Electronic and Thermal Properties of Semiconductors, BIADS '91, Journal de Physique IV 1, 241, (1991).

1. N. MACHET, C. HUBERT-HABART, V. BOUDINEAU, D. FOURNIER et B.C. FORGET, Étude de l'éblouissement des caméras CCD à transfert de trame par un rayonnement laser visible ou proche infrarouge, soumis au colloque RADECS (Cannes), 1997
2. B.C. FORGET, D. FOURNIER et J.-P. ROGER, Les méthodes photothermiques à l'échelle du micron : Profil de diffusivté en profondeur, mesure de diffusivité de couches minces et caractérisation de céramiques, Journée SFT : Thermique à l'échelle micronique et submicronique (janvier 1997).
3. D. FOURNIER et B.C. FORGET, Photodéflexion, photoréflexion et radiométrie infrarouge, à paraître dans Contrôle Non Destructif (COFREND 1997).
4. N. MACHET, C. HUBERT-HABART, V. BOUDINEAU, D. FOURNIER et B.C. FORGET, Étude de l'éblouissement des caméras CCD à transfert de trame par un rayonnement laser visible ou proche infrarouge, présenté au colloque Optronique et défense (Montigny le Bretonneux), 1996